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Keysight U2722A Labview Virtual Instruments (VIs) for characterizing single (IV-curve) or dual transistor configurations using one or 2 SMUs.

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Keysight U2722A IV-Curve Measurements

This repository contains several drivers for measuring transistor IV-curves of single or two-transistor configurations for the Keysight U2722A SMU (https://www.keysight.com/us/en/products/source-measure-units-smu/u2722a-u2723a-usb-modular-source-measure-units-smu.html). A detailed description of every VI-file, along with a use case is given below. SMU_IV single.vi uses a single U2722A SMU, but the other Virtual Instruments (VIs) require 4 SM channels, so 2 SMU's are needed. Using LabView drivers instead of the proprietary PathWave BenchVue Software has the advantage of having a more detailed control over the experiments.

SMU_IV single.vi

Simple current-voltage characterization of a transistor (https://en.wikipedia.org/wiki/Current%E2%80%93voltage_characteristic). For each gate voltage, the drain-source voltage is swept over a certain range. The interface of this program is shown below:

SMU_IV dual.vi

Analogous to the previous experiment, but using an additional SMU to concurrently and independently characterize 2 transistors. This is useful when characterizing a large amount of transistors, e.g. on a wafer.

SMU_IV_gate_2_sweep.vi

The purpose of this program is illustrated in the figure below:

This setup allows for a variety of configurations. In the simplest case, you can have a transistor with a resistive load. In this example, T2 represents an active load in a cascode with PNP BJTs, where the gate voltage can be swept or kept constant.

The interface of the instrument is shown below:

SMU_IV_gate_2_constant.vi

Similar to the previous VI, but simpler in the sense that only the first gate voltage is swept, while the second gate is biassed by a constant voltage. Thus, the previous program is more general.

Note about logging the data

New data is appended to the target file, to ensure that experiments are not accidentally overwritten. For the two-transistor configurations, the order of the sweeps is as follows: gate 1 (the "input"), Vdd, gate 2 (if not constant). This should help with the interpretation of the results.

About

These drivers were written for the Translational Neuroelectronics Lab at Columbia University, led by Prof. Dion Khodagholy (https://www.dion.ee.columbia.edu/).

About

Keysight U2722A Labview Virtual Instruments (VIs) for characterizing single (IV-curve) or dual transistor configurations using one or 2 SMUs.

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