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It is often difficult to find minor phase grains that are weakly diffracting in scanning experiments, and large indexing tolerances are often used. It would be nice to score grains by their sinograms to more easily identify dodgy grains. This means we need a scalar metric for sinogram quality. Dodgy grains are often identified by looking at dty vs omega of their 4D peaks and seeing no obvious sinusoidal shape.
The text was updated successfully, but these errors were encountered:
It is often difficult to find minor phase grains that are weakly diffracting in scanning experiments, and large indexing tolerances are often used. It would be nice to score grains by their sinograms to more easily identify dodgy grains. This means we need a scalar metric for sinogram quality. Dodgy grains are often identified by looking at dty vs omega of their 4D peaks and seeing no obvious sinusoidal shape.
The text was updated successfully, but these errors were encountered: